Table of Contents:
00:09 Lecture 3.3: Tapping Mode Scanning Tool / Feedback Controls ...
00:25 From the last lecture
00:59 Amplitude modulated scanning (basic)
05:40 Problem 1: Scanning along a silicon trench Given
08:46 AMS Example 1: Silicon trench
09:21 Note: the feature has a different property than the substrate
09:29 Operating conditions and cantilever properties tab
10:27 When integral gain is 0.0005
10:41 First harmonic amplitude vs X distance
12:14 Problem 2: Scanning a step Given
13:35 AMS Example 4: Effect of controller gains
14:08 Topography images
16:57 Integral gain = 0.001
This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. ([ Ссылка ])
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
