Table of Contents:
00:09 Lecture 4.4: Key Experimental Results in FM-AFM I
00:14 From the last lecture
01:05 Atomic resolution with contact mode?
06:39 Atomic resolution with contact mode- Issues
11:19 Atomic resolution with AM-AFM?
13:42 Atomic resolution using FM-AFM
18:30 Atomic resolution using FM-AFM
20:48 Sub-atomic resolution using FM-AFM?
23:06 FM-AFM in liquids
This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. ([ Ссылка ])
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
