Table of Contents:
00:09 Lecture 4.3: Experimental Details
00:14 From the last lecture
01:23 What is required?
06:01 The quartz tuning fork
07:41 Quartz
11:51 Electrode geometry
14:08 An example *
16:19 Electrically measured tuning curves
18:12 Calibrating tip motion of quartz tuning fork
19:35 Quartz based probes
21:00 Tuning fork based AFM
21:57 An example with constant excitation

This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. ([ Ссылка ])

Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.

The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.


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