Atomic force microscopy is a versatile technique for looking at surfaces, an excellent complementary technique to SEM and 3D optical profilometry. But it's more than just pretty pictures! AFM can give insight into mechanical, electromagnetic, or chemical properties of a surface, as well as giving highly precise topographic measurements. This talk will introduce the basics of AFM and will highlight a small number of applications. Presenter: Kathy Walsh, MRL, University of Illinois at Urbana-Champaign
