In the chiplet age, squeezing more value out of every ATE test second is not just a goal; it's a necessity. Discover how leveraging machine learning and advanced data analytics can revolutionize semiconductor testing, making every second count. Learn about cutting-edge strategies for optimizing test seconds, ensuring that the rapid pace of design complexity and integration doesn't outpace the capacity for innovation. Read the full article here: [ Ссылка ]
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