The Dimension® Edge™ Atomic Force Microscope (AFM) System incorporates Bruker's latest technology advances to provide the highest levels of performance, functionality, and accessibility in its class. Based on the ultimate Dimension Icon® platform, the Edge System has been designed from top to bottom to deliver the low drift and low noise necessary to achieve publication ready data in minutes instead of hours, all at price points well below expectations for such performance. In addition, integrated visual feedback and preconfigured settings enable expert level results simply and consistently, making the most advanced large-sample atomic force microscopy capabilities and techniques available to every facility and user.
