Table of Contents:
00:09 Lecture 4.1: Relationship between Frequency Shift and ...
00:15 From the last lecture
01:24 Force spectroscopy
03:56 Approach curves in FM-AFM
06:03 Understanding f0 and f0' in terms of potential energy
10:42 Understanding f0 and f0' in terms of potential energy
13:04 Utot as a function of Z
17:08 f0' in a quadratic potential
21:28 f0' in perturbed potentials
22:42 f0' in perturbed potentials
23:53 f0' upon approach
This video is part of nanoHUB-U's course Fundamentals of Atomic Force Microscopy: Part 2 Dynamic AFM Methods. ([ Ссылка ])
Structured as two 5-week courses, this unique set of courses developed by Profs. Ron Reifenberger and Arvind Raman, look at the underlying fundamentals of atomic force microscopy and exposes the knowledge base required to understand how an AFM operates.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy.
