This is an introduction to the concepts and terminology of Automatic Test Pattern Generation (ATPG) and Digital IC Test.
In this video, we will go over the following concepts:
- The difference between defects and faults
- The fault models commonly used
- How patterns are generated for combinational, sequential, and scanned circuits
- Basic DFT design rules
- Special tests such as for memory, cores, self-test, compression, I/Os, etc.
- Test escapes and their effect on test volume and product quality
- Basic diagnostics capabilities
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