Quantitative Analysis is an integral part of Energy Dispersive (EDS) analysis. X-ray mapping is also a standard application of EDS data collection. So what happens when we combine two individually valuable capabilities? The result is a full characterization revealing more about a sample than with each individual function. Of course, each aspect has requirements, and sometimes those requirements are in conflict, such as finding the right amount of time to get high statistics for quant accuracy, but still maintaining a high-resolution image.

In this webinar, we review the fundamental requirements for quantitative analysis and for X-ray mapping, and then explore methods for generating the most accurate, high-quality data.

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